LI Wei, XU Jie-ping, CUI Jian, et al. UHV SYSTEM OF THE HEAT LOAD TESTING DEVICE FOR SCU[J]. VACUUM AND CRYOGENICS, 2014, 20(3): 167-169. DOI: 10.3969/j.issn.1006-7086.2014.03.010
Citation: LI Wei, XU Jie-ping, CUI Jian, et al. UHV SYSTEM OF THE HEAT LOAD TESTING DEVICE FOR SCU[J]. VACUUM AND CRYOGENICS, 2014, 20(3): 167-169. DOI: 10.3969/j.issn.1006-7086.2014.03.010

UHV SYSTEM OF THE HEAT LOAD TESTING DEVICE FOR SCU

  • Design and fabrication of the UHV system of the heat load testing device for SCU are introduced. The ion pump, NEG pump and cryogenic condensation surface are used to reduce the system pressure. The device can reach the pressure of 7.8×10-8 Pa at the room temperature and 1.7×10-8 Pa at the low temperature. The demand of the storage ring vacuum system for SSRF can be met.
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