The Comparison of Different Calculating Method Based on Microelectronic Devices Heavy Ion to Proton Single Event Effect Cross Section

In view of the 0.25 μm CMOS process SRAM's heavy ion and proton single event effect(SEU)experiment data,three different common prediction method based on heavy ion to proton single event effect data are analyzed.Meanwhile,the prediction result is compared with the experiment.Also we calculated the on orbit SEU error rate of different data on the Space Radiation software.At last,the accuracy and the applicability of those different method were been concluded.