TESTING OF SINGLE EVENT BURNOUT INDUCED BY HEAVY ION IN POWER MOSFET

CAO Zhou, YANG Shi-yu, DA Dao-an. TESTING OF SINGLE EVENT BURNOUT INDUCED BY HEAVY ION IN POWER MOSFET[J]. VACUUM AND CRYOGENICS, 2004, 10(1): 21-25.

Citation:

CAO Zhou, YANG Shi-yu, DA Dao-an. TESTING OF SINGLE EVENT BURNOUT INDUCED BY HEAVY ION IN POWER MOSFET[J]. VACUUM AND CRYOGENICS, 2004, 10(1): 21-25.

Citation:

CAO Zhou, YANG Shi-yu, DA Dao-an. TESTING OF SINGLE EVENT BURNOUT INDUCED BY HEAVY ION IN POWER MOSFET[J]. VACUUM AND CRYOGENICS, 2004, 10(1): 21-25.

Abstract

Two test methods for Sing Event Burnout （SEB） have been reported in details. Based on analysis of the principle for nondestructive testing of single event burnout, the test equipment has been developed, and adjusted used by the system of （）²⁵²Cf source. The SEB has been inspected for Power MOSFET by heavy ion supplied with HI-13 accelerator.

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