EFFECTS OF PULSED LASER PARAMETERS ON SINGLE EVENT UPSET THRESHOLD ENERGY
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Graphical Abstract
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Abstract
Effects of pulsed laser parameters such as laser wavelength,beam spot size,pulse energy and pulse duration on threshold energy in laser simulating Single Event Effect testing are analyzed.The Single-Event-Upset(SEU) pulsed laser threshold energy predicted by A.Douin’s theory accords well with the results acquired in author's testing.At the same time,the calibrating coefficient of pulse threshold energy in SEU induce by laser calculated with threshold LET equivalence principle shows that the 1 064 nm picosecond pulsed laser threshold energy-equivalent heavy-ion LET value is independent of charge collection depth in device sensitive volume.
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