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Investigation of burnout mechanism in microwave GaAs power FETs:Part Ⅱ.RF hurnout
Yuan Zeliang, Fan Chuizhen
1994, 13(4): 187-190.
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VCSE-B(Ⅱ)manufacture of vacuum comparison standard device
Li Zhenghai, Li Detian, Hu Wei, Li Li
1994, 13(4): 191-197.
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Diamond thin films grown up by microwave plasma CVD
Sun Yining, Guo Wantu, Li Jinqi
1994, 13(4): 198-200.
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A constant pressure low range flowmeter
Zhang Dixin, Lu Shiliang, Li Wangkui, Liu Qiang, Yu Xipan
1994, 13(4): 201-204,226.
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Calculation of the vacuum svstem used in FYS-1 installation of manual TIG welding for prevention of oxidization
Ma Mianjun, Hu Tinliang
1994, 13(4): 205-208.
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The mechanisms of crvaqenic creep for metal materials
Zhang Jianke
1994, 13(4): 209-213.
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LYOVAC series freeze drying plants
Zhu Wu
1994, 13(4): 214-218.
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Leak detective techniques in spacecraft use
Yan Rongxing, Xiao Xiangzhen, Zhang Jiazu
1994, 13(4): 219-226.
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The analysis and research on the structure of the control circuits of the digital vacuum gauge
Wang Xianlu, Zhu Wu
1994, 13(4): 227-231,236.
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Electron positron affinity photocathode
Li Chaomu
1994, 13(4): 232-236.
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A new tvpe three staqe pulse tube refriqerator
Yang Tianxin
1994, 13(4): 237-239.
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