杜威志, 王多书, 李晨, 等. 二次电子发射系数的光电测试方法研究[J]. 真空与低温, 2014, 20(6): 332-334,343. DOI: 10.3969/j.issn.1006-7086.2014.06.006
引用本文: 杜威志, 王多书, 李晨, 等. 二次电子发射系数的光电测试方法研究[J]. 真空与低温, 2014, 20(6): 332-334,343. DOI: 10.3969/j.issn.1006-7086.2014.06.006
DU Wei-zhi, WANG Duo-shu, LI Chen, et al. STUDY OF SECONDARY ELECTRON EMISSION COEFFICIENT BY PHOTOELECTRIC TEST METHOD[J]. VACUUM AND CRYOGENICS, 2014, 20(6): 332-334,343. DOI: 10.3969/j.issn.1006-7086.2014.06.006
Citation: DU Wei-zhi, WANG Duo-shu, LI Chen, et al. STUDY OF SECONDARY ELECTRON EMISSION COEFFICIENT BY PHOTOELECTRIC TEST METHOD[J]. VACUUM AND CRYOGENICS, 2014, 20(6): 332-334,343. DOI: 10.3969/j.issn.1006-7086.2014.06.006

二次电子发射系数的光电测试方法研究

STUDY OF SECONDARY ELECTRON EMISSION COEFFICIENT BY PHOTOELECTRIC TEST METHOD

  • 摘要: 采用电子枪产生的电子进行材料二次电子发射系数的测量与研究,该方法由于实现过程较为复杂且很难获得微小流量入射原电子等限制了其应用。故采用紫外激发金属锌获得入射原电子的方法,利用高压电源和静电计,实现了材料二次电子发射系数的精确测量。在电子倍增器中分别测试单级打拿极二次电子发射系数和倍增器增益,比较后获得了材料二次电子发射系数精确测量的方法。利用该方法,研究了氧化镁材料的二次电子发射性能,得到了基于氧化镁发射材料的电子倍增器增益。

     

    Abstract: The method of mearsurement and study on secondary electron emission coefficient by electrons produced by electron gun limits the application with complicated implementation process and difficult acquisition of micro-flow incident primary electrons. Therefore an acurate measurement of secondary electron emission coefficient needs the method of obtaining incident primary electeonics by ultraviolet excitation metal zinc through high voltage power supply and electrometer. Respectively test stand-alone dynode with secondary electron emission coefficient and multiplier gain in electron multiplier. An acurate measurement of secondary electron emission coefficient is obtained. Study the secondary electron emission performance of magnesium oxide(MgO)material after comparison. Hence the electron multiplier gain based on magnesium oxide emission materials are acquired.

     

/

返回文章
返回