张翔宇, 田旭, 刘博文, 等. 钴金属薄膜制备研究进展[J]. 真空与低温, 2020, 26(5): 410-416. DOI: 10.3969/j.issn.1006-7086.2020.05.008
引用本文: 张翔宇, 田旭, 刘博文, 等. 钴金属薄膜制备研究进展[J]. 真空与低温, 2020, 26(5): 410-416. DOI: 10.3969/j.issn.1006-7086.2020.05.008
ZHANG Xiangyu, TIAN Xu, LIU Bowen, et al. Research Progress in Preparation of Cobalt Metal Thin Films[J]. VACUUM AND CRYOGENICS, 2020, 26(5): 410-416. DOI: 10.3969/j.issn.1006-7086.2020.05.008
Citation: ZHANG Xiangyu, TIAN Xu, LIU Bowen, et al. Research Progress in Preparation of Cobalt Metal Thin Films[J]. VACUUM AND CRYOGENICS, 2020, 26(5): 410-416. DOI: 10.3969/j.issn.1006-7086.2020.05.008

钴金属薄膜制备研究进展

Research Progress in Preparation of Cobalt Metal Thin Films

  • 摘要: 近年来,由于钴薄膜具有优良的物理化学性能如低电阻率、高磁各向异性、高催化活性等引起人们的广泛关注。在集成电路领域,基于钴优异的低电阻率特性,钴可以替代铜成为新一代半导体导线材料,在10 nm、7 nm,甚至在5 nm、3 nm芯片制造工艺下作为互连导线,可以提升导电性、降低功耗并大幅减小芯片体积,使芯片效能更高。目前已经有许多制备钴金属薄膜的研究,本文重点介绍利用化学气相沉积技术、热原子层沉积技术以及等离子体辅助原子层沉积技术制备钴薄膜的研究现状,讨论各种制备方法的优劣,对所使用的前驱体做了总结,并展望了发展趋势。

     

    Abstract: In recent years,due to the excellent physical and chemical properties of cobalt thin films,such as low resistivity,high magnetic anisotropy and high catalytic activity,it has attracted extensive attention.In the field of integrated circuits,based on the excellent low resistivity characteristics of cobalt,cobalt can replace copper as a new generation of semiconductor wire material.As an interconnect wire in 10 nm,7 nm,or even 5 nm,3 nm chip manufacturing process,it can improve the conductivity,reduce power consumption and greatly reduce the chip volume,which makes the chip more efficient.At present,there are many researches on the preparation of cobalt thin films.This paper mainly introduces the research status of cobalt thin films deposited by chemical vapor deposition,thermal atomic layer deposition and plasma assisted atomic layer deposition,discusses the advantages and disadvantages of various preparation methods,summarizes the precursors used in preparation,and prospects the development trend.

     

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