李婧, 陈世舜, 贾艳辉, 等. 基于确信可靠度的离子推力器可靠性分析和试验设计[J]. 真空与低温, 2022, 28(5): 524-531. DOI: 10.3969/j.issn.1006-7086.2022.05.004
引用本文: 李婧, 陈世舜, 贾艳辉, 等. 基于确信可靠度的离子推力器可靠性分析和试验设计[J]. 真空与低温, 2022, 28(5): 524-531. DOI: 10.3969/j.issn.1006-7086.2022.05.004
LI Jing, CHEN Shishun, JIA Yanhui, et al. Reliability Analysis and Test Design of Ion Thruster Based on Belief Reliability Theory[J]. VACUUM AND CRYOGENICS, 2022, 28(5): 524-531. DOI: 10.3969/j.issn.1006-7086.2022.05.004
Citation: LI Jing, CHEN Shishun, JIA Yanhui, et al. Reliability Analysis and Test Design of Ion Thruster Based on Belief Reliability Theory[J]. VACUUM AND CRYOGENICS, 2022, 28(5): 524-531. DOI: 10.3969/j.issn.1006-7086.2022.05.004

基于确信可靠度的离子推力器可靠性分析和试验设计

Reliability Analysis and Test Design of Ion Thruster Based on Belief Reliability Theory

  • 摘要: 针对小行星探测用LIPS-300离子推力器多工况、长寿命、高可靠和极端小子样特征,提出了一种基于确信可靠度理论的可靠性评估方法,适用于当前离子推力器服役过程中性能退化不确定性情况下的可靠性评估。首先对离子推力器进行了功能、性能和裕量分析(Function,Performance and Margin Analysis,FPMA),识别和确定了离子推力器的关键失效模式为电子反流,并确定了电子反流这一失效模式对应的性能参数及阈值;其次在FPMA基础上完成了离子推力器裕量方程、退化方程和可靠性度量方程的建立;最后,为了验证可靠性评估模型的准确性,在综合考虑地面试验技术条件和背景任务的基础上设计了针对关键失效模式电子反流的试验方案。

     

    Abstract: Aiming at the characteristics of multiple working conditions,long life,high reliability and extremely small samples of LIPS-300 ion thruster for asteroid exploration,a reliability evaluation method based on belief reliability theory is proposed.This theory is suitable for the reliability assessment under the uncertainty of performance degradation of the current ion thruster in service.Firstly,the Function,Performance and Margin Analysis (FPMA) of ion thruster is carried out,and the key performance parameters and performance thresholds of ion thruster are identified and determined as electron back-streaming;Secondly,the margin equation,degradation equation and reliability measurement equation of ion thruster are established based on FPMA;Finally,in order to verify the accuracy of the reliability evaluation model,based on the comprehensive consideration of the ground test technical conditions and background tasks,a test scheme for the key failure mode,namely electron back-streaming,is designed.

     

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