赵志伟, 张天平, 冉文亮, 等. 离子推力器中空心阴极耦合放电的试验研究[J]. 真空与低温, 2022, 28(6): 650-659. DOI: 10.3969/j.issn.1006-7086.2022.06.004
引用本文: 赵志伟, 张天平, 冉文亮, 等. 离子推力器中空心阴极耦合放电的试验研究[J]. 真空与低温, 2022, 28(6): 650-659. DOI: 10.3969/j.issn.1006-7086.2022.06.004
ZHAO Zhiwei, ZHANG Tianping, RAN Wenliang, et al. Experimental Study on Coupling Discharge of Hollow Cathode and Ion Thruster[J]. VACUUM AND CRYOGENICS, 2022, 28(6): 650-659. DOI: 10.3969/j.issn.1006-7086.2022.06.004
Citation: ZHAO Zhiwei, ZHANG Tianping, RAN Wenliang, et al. Experimental Study on Coupling Discharge of Hollow Cathode and Ion Thruster[J]. VACUUM AND CRYOGENICS, 2022, 28(6): 650-659. DOI: 10.3969/j.issn.1006-7086.2022.06.004

离子推力器中空心阴极耦合放电的试验研究

Experimental Study on Coupling Discharge of Hollow Cathode and Ion Thruster

  • 摘要: 空心阴极在离子推力器中耦合放电时受到的轰击溅射的离子强度与其单独试验有所不同,导致其在两种情况下寿命出现差异,离子推力器放电室内等离子体参数测量难度较大,相关的研究很少。基于这一现状,对离子推力器和空心阴极进行了耦合放电试验。采用控制变量的方法,在不同的阳极电流、阳极气体流量、磁场强度以及放电室封闭程度等条件下,使用朗缪尔探针测量了放电室内的等离子体参数,得到了各种工况下等离子体中电子温度、电子密度、空间电势等的轴向和径向变化趋势,分析了这些变化在空心阴极损耗方面所起的作用,为空心阴极在两种条件下的等离子体模型和寿命损耗的对比提供数据基础。

     

    Abstract: The ion sputtering intensity of the hollow cathode in the coupling discharge in the ion thruster is different from that in the single experiment,which leads to the difference of its lifetime in the two conditions.There are few related researches because of the difficulties to measure the plasma parameters in the discharge chamber of the ion thruster.Based on this situation,the coupling discharge experiments were carried out with an ion thruster and a hollow cathode.By controlling the variables,the plasma parameters in the discharge chamber were measured by Triple Langmuir Probe under the different conditions of anode current,anode flow rate,magnetic field intensity and sealing degree of discharge chamber.The axial and radial variation trends of electron temperature,electron density and space potential of plasma under various working conditions were obtained.The effect of these working parameters on the lifetime degradation of hollow cathode was analyzed.It provides data basis for the comparison of plasma characteristics and lifetime degradation of hollow cathode under two conditions.

     

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