直流磁控溅射沉积锰酸锶镧薄膜的结构与相变特性研究

CRYSTAL STRUCTURE AND METAL-INSULATOR TRANSITION PROPERTIES OF DC MAGNETRON SPUTTERED La0.825Sr0.175MnO3 FILMS

  • 摘要: 通过固相反应及陶瓷烧结工艺制备了具有钙钛矿结构的锰酸锶镧陶瓷靶,利用该靶材采用直流磁控溅射法在硅(100)和石英玻璃基片上制备了锰酸锶镧薄膜。研究了沉积气氛对薄膜晶体结构的影响。对高溅射压力下不同溅射功率沉积的薄膜样品的电阻-温度特性进行测量,显示薄膜具有-14~-22℃的高的金属到绝缘体的转变温度,并且随溅射功率的增加,薄膜在相变点附近的电阻变化幅度明显提高。

     

    Abstract: The La0.825Sr0.175MnO3(LSMO)target with perovskite structure was prepared by conventional solid state reaction and standard ceramic technique,which was used to deposited LSMO films on single silicon(100) and q uartz glass substrate by DC magnetron sputtering system.The influence of deposition parameter to the films crystal st ructure was investigated.Temperature dependence of resistance of films that was deposited with different sputtering power showed a high metal-insulator transition temperature.The change of films resistance near the transition temper ature was enhanced with the increase of sputtering power.

     

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