一种确定基片架最佳沉积区域的试验方法

A EXPERIMENTAL METHOD TO DETERMINE OPTIMUM DEPOSITED AREA OF SUBSTRATE SUPPORT

  • 摘要: 分析了确定基片架上最佳沉积区域的重要性,采用一种简单可行的试验方法,对ZZ-SX500型光学镀膜机的拱型基片架进行了研究,给出了试验方法的理论依据及实际应用结果,并对试验中的关键仪器即MKG-5型光电极值膜厚监控仪进行了可靠性评价试验。

     

    Abstract: The essentiality of determination on optimum deposited area of substrate support has been analysed. Using a experimental method, the arch sustrate support of ZZ-SX500 model optical plating machine hasbeen studied. Theoretical foundation and practical results of the experimental method have been given. The reliability evaluateing test on the key experimental instrument namely MKG-5 photoelectricity extremum model film thickness measuring-controling instrument has been conducted.

     

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