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THE EFFECT OF CONTACT INTERFACES ON THERMAL CONTACT RESISTANCE AT LOW TEMPERATURE AND VACUUM
XU Lie, ZHANG Tao, XIONG Wei, YANG Jun, XU Jiamei
1998, 4(1): 1-4.
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THE MAIN INFLUENCING FACTORS OF HIGH VACUUM MULTILAYER INSULATION
ZHOU Chong, WANG Rongshun, LU Xuesheng, GU Anzhong
1998, 4(1): 5-8.
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DEVELOPMENT OF 70 MW CLASS SUPERCONDUCTING GENERATORS IN JAPAN
GUAN Qiamin, FU Qilun
1998, 4(1): 9-12.
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PROGRESS ON THE APPLICATIONS OF SUPERCONDUCTIVITY IN PWOER SYSTEMS
GUAN Qiamin, FU Qilun
1998, 4(1): 13-16.
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SUPERFLUID HELIUM DEWARS REFRIGERATORS
XU Lie, XU Jiamei, ZHAO Lanping
1998, 4(1): 17-19.
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VACUUM COMPARISON FOR RECIPROCATING VACUUM PUMP OF SINGLE CYLINDER DOUBLE ACTING WITH SIGLE SUCTION AND DOUBLE SUCTION
JIN Yongxi, GU Haiming
1998, 4(1): 20-25.
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INFLUENCES OF DEPOSITION PRESSURE ON MW—PCVD DIAMOND FILM
YU Shiji, WU Qinchong
1998, 4(1): 26-29.
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A RFDIRECT CURRENT PLASMAENHANCED CVD INSTRUMENT
CHEN Jianguo, CHENG Yuhang, WU Yiping, QIAO Xueliang
1998, 4(1): 30-34.
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NEW MICROWAVE PLASMA CVD SET UP FOR DIAMOND FILM GROWTH
LU Qingao, WU Qinchong, SUI Yifeng, KUANG Jingan, ZHOU Yongcheng, YU Shiji, WANG Shouguo
1998, 4(1): 35-37.
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DEVELOPMENT SITUATION AND TECHNICAL ANALYSIS OF ITO FILM
ZHENG Guangwen
1998, 4(1): 38-40.
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THE PRINCIPLES, METHODS AND TECHNIQUES FOR LIQUID CONTENT MEASUREMENT IN SPACE(2)
DA Daoan, ZHANG Tianping
1998, 4(1): 41-51.
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THE RECENT DEVELOPMENT OF HIGH DENSITY PLASMA SOURCES
HUANG Guangzhou, ZHANG Shusheng, YU Jirong, LIANG Dizhong, YANG Yingjie
1998, 4(1): 52-56.
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APPLICATIONS OF SINGLE CHIP MICRO COMPUTERS FOR NONDESTRUCTIVE TEST OF VACUUM IN THE CANS
ZHOU Zhonghao, HUANG Guangzhou, WEI Kesheng
1998, 4(1): 57-60.
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